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/*
I2C Stress Test include file
*/
#ifndef __AXI_I2C_TEST_CASE_H__
#define __AXI_I2C_TEST_CASE_H__
#include <linux/i2c.h>
#define I2C_TEST_PASS (0)
//if test fail, the return value should be negative.
//typedef int (*run_i2c_test)(struct i2c_client *apClient);
#define I2C_TEST_CASE_NAME_SIZE 20
#define ARRAY_AND_SIZE(x) (x), ARRAY_SIZE(x)
#define __I2C_STRESS_TEST_CASE_ATTR(_name) { \
.name = __stringify(_name), \
.run = _name, \
}
/**
* struct i2c_test_case_info - for i2c stress test
* @type: name for test case
* @run: the main function for test
*
* The concrete of I2C test case struct should be added to i2c test run before
* running tests. Recommend to be called in probe function in i2c driver. The
* function run should be implemented by i2c driver and the negative value(error
* code) should be returned if the test fails. Otherwise, zero should be returned.
*/
struct i2c_test_case_info {
const char *name;
int (*run)(struct i2c_client *apClient);
};
extern int i2c_add_test_case(struct i2c_client *apClient,
const char *apTestSetName,
struct i2c_test_case_info const *apTestCaseList,
unsigned anNum);
/*log function for logging in running tests*/
extern int i2c_log_in_test_case(
const char *fmt, ...);
#endif //__AXI_I2C_TEST_CASE_H__
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