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/*
* linux/include/linux/mtd/bbm.h
*
* NAND family Bad Block Management (BBM) header file
* - Bad Block Table (BBT) implementation
*
* Copyright © 2005 Samsung Electronics
* Kyungmin Park <kyungmin.park@samsung.com>
*
* Copyright © 2000-2005
* Thomas Gleixner <tglx@linuxtronix.de>
*
* This program is free software; you can redistribute it and/or modify
* it under the terms of the GNU General Public License as published by
* the Free Software Foundation; either version 2 of the License, or
* (at your option) any later version.
*
* This program is distributed in the hope that it will be useful,
* but WITHOUT ANY WARRANTY; without even the implied warranty of
* MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE. See the
* GNU General Public License for more details.
*
* You should have received a copy of the GNU General Public License
* along with this program; if not, write to the Free Software
* Foundation, Inc., 51 Franklin St, Fifth Floor, Boston, MA 02110-1301 USA
*
*/
#ifndef __LINUX_MTD_BBM_H
#define __LINUX_MTD_BBM_H
#define NAND_MAX_CHIPS 8
/**
* struct nand_bbt_descr - bad block table descriptor
* @options: options for this descriptor
* @pages: the page(s) where we find the bbt, used with option BBT_ABSPAGE
* when bbt is searched, then we store the found bbts pages here.
* Its an array and supports up to 8 chips now
* @offs: offset of the pattern in the oob area of the page
* @veroffs: offset of the bbt version counter in the oob are of the page
* @version: version read from the bbt page during scan
* @len: length of the pattern, if 0 no pattern check is performed
* @maxblocks: maximum number of blocks to search for a bbt. This number of
* blocks is reserved at the end of the device where the tables are
* written.
* @reserved_block_code: if non-0, this pattern denotes a reserved (rather than
* bad) block in the stored bbt
* @pattern: pattern to identify bad block table or factory marked good /
* bad blocks, can be NULL, if len = 0
*
* Descriptor for the bad block table marker and the descriptor for the
* pattern which identifies good and bad blocks. The assumption is made
* that the pattern and the version count are always located in the oob area
* of the first block.
*/
struct nand_bbt_descr {
int options;
int pages[NAND_MAX_CHIPS];
int offs;
int veroffs;
uint8_t version[NAND_MAX_CHIPS];
int len;
int maxblocks;
int reserved_block_code;
uint8_t *pattern;
};
#define NAND_BBT_NRBITS_MSK 0x0000000F
#define NAND_BBT_1BIT 0x00000001
#define NAND_BBT_2BIT 0x00000002
#define NAND_BBT_4BIT 0x00000004
#define NAND_BBT_8BIT 0x00000008
#define NAND_BBT_LASTBLOCK 0x00000010
#define NAND_BBT_ABSPAGE 0x00000020
#define NAND_BBT_SEARCH 0x00000040
#define NAND_BBT_PERCHIP 0x00000080
#define NAND_BBT_VERSION 0x00000100
#define NAND_BBT_CREATE 0x00000200
#define NAND_BBT_CREATE_EMPTY 0x00000400
#define NAND_BBT_SCANALLPAGES 0x00000800
#define NAND_BBT_SCANEMPTY 0x00001000
#define NAND_BBT_WRITE 0x00002000
#define NAND_BBT_SAVECONTENT 0x00004000
#define NAND_BBT_SCAN2NDPAGE 0x00008000
#define NAND_BBT_SCANLASTPAGE 0x00010000
#define NAND_BBT_USE_FLASH 0x00020000
#define NAND_BBT_NO_OOB 0x00040000
#define NAND_BBT_NO_OOB_BBM 0x00080000
#define NAND_BBT_DYNAMICSTRUCT 0x80000000
#define NAND_BBT_SCAN_MAXBLOCKS 4
#define NAND_SMALL_BADBLOCK_POS 5
#define NAND_LARGE_BADBLOCK_POS 0
#define ONENAND_BADBLOCK_POS 0
#define ONENAND_BBT_READ_ERROR 1
#define ONENAND_BBT_READ_ECC_ERROR 2
#define ONENAND_BBT_READ_FATAL_ERROR 4
struct bbm_info {
int bbt_erase_shift;
int badblockpos;
int options;
uint8_t *bbt;
int (*isbad_bbt)(struct mtd_info *mtd, loff_t ofs, int allowbbt);
struct nand_bbt_descr *badblock_pattern;
void *priv;
};
extern int onenand_scan_bbt(struct mtd_info *mtd, struct nand_bbt_descr *bd);
extern int onenand_default_bbt(struct mtd_info *mtd);
#endif
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